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Semiconductor characterization techniques : proceedings of the topical conference on characterization techniques for semiconductor materials and devices

Topical Conference on Characterization Techniques for semiconductor materials and devices

Kategorie

Natur

Titel

Semiconductor characterization techniques : proceedings of the topical conference on characterization techniques for semiconductor materials and devices

Beschreibung

Semiconductor characterization techniques : proceedings of the topical conference on characterization techniques for semiconductor materials and devices

Physische Beschreibung

XI, 532 p. : ill. ; 23 cm.

Datum

1978

Ort der Veröffentlichung

Princenton, N.J.

Dorf

STATI UNITI

Zunge

ID

IT\ICCU\CAG\1837871

Ressourcenverbindungen

Biblioteca del Distretto biomedico scientifico - sezione Beniamino Orrù

Etikett

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