Advances in X-ray diffractometry and X-ray spectrography : a volume of fifteen selected reprints from Philips laboratories, Irvington on Hudson, New York

Parrish, William

$Advances in X-ray diffractometry and X-ray spectrography : a volume of fifteen selected reprints from Philips laboratories, Irvington on Hudson, New York$

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Titel

Advances in X-ray diffractometry and X-ray spectrography : a volume of fifteen selected reprints from Philips laboratories, Irvington on Hudson, New York

Namen

[Autore] Parrish, William

Beschreibung

Advances in X-ray diffractometry and X-ray spectrography : a volume of fifteen selected reprints from Philips laboratories, Irvington on Hudson, New York / edited by William Parrish

Physische Beschreibung

XV, 233 p. : ill. ; 23 cm.

Datum

1962

Ort der Veröffentlichung

Eindhoven

Dorf

PAESI BASSI

Zunge

INGLESE

Titel Opera

Advances in X-ray diffractometry and X-ray spectrography